Resistivity Measurement System Suite, 4-Point Probe
Subject: Resistivity Measurement System Suite, 4-Point ProbeSolicitation Number: SP4706-26-Q-0026Notice Type: SOLICITNAICS: 334516Set-Aside: No Set aside usedNotice Published: 09-01-26Response Due: 09-11-26Agency: DEPT OF DEFENSEOffice: DEFENSE LOGISTICS AGENCYContact: Shaun Bunnell This email address is being protected from spambots. You need JavaScript enabled to view it. Ph: (614) 693-2603Office Address: COLUMBUS, OH 43218Place of Performance: Philadelphia, PA Related Notices:
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The objective of this acquisition is to provide the Department with a comprehensive, multi-environment resistivity measurement capability. This suite will support mission-critical analysis of semiconductor materials, thin films, and conductive polymers across a full range of physical and thermal conditions. Please see attached Statement of Work (SOW) for more specific technical information.